10.1364/AO.55.008368.d002 Jyoti Jaiswal Jyoti Jaiswal Satyendra Mourya Satyendra Mourya Gaurav Malik Gaurav Malik Samta Chauhan Samta Chauhan Amit Sanger Amit Sanger Ritu Daipuriya Ritu Daipuriya Manpreet Singh Manpreet Singh Ramesh Chandra Ramesh Chandra Data File 2: Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry Optica Publishing Group 2016 constant surface roughness sample surface characteristics EMA thickness Lorentz coefficients nm ao 10 October 2016 Determination Applied Optics spectroscopic ellipsometry Correlation values volume fraction data oxide nanostructured Ti films Drude 2016-10-10 00:00:00 Dataset https://opticapublishing.figshare.com/articles/dataset/Data_File_2_Determination_of_optical_constants_including_surface_characteristics_of_optically_thick_nanostructured_Ti_films_analyzed_by_spectroscopic_ellipsometry/4930100 Correlation values between the surface roughness, thickness & volume fraction of oxide/Ti EMA layer and Drude & Lorentz coefficients for the sample T2~250 nm. Originally published in Applied Optics on 10 October 2016 (ao-55-29-8368)