10.1364/AO.55.008368.d002
Jyoti Jaiswal
Jyoti
Jaiswal
Satyendra Mourya
Satyendra
Mourya
Gaurav Malik
Gaurav
Malik
Samta Chauhan
Samta
Chauhan
Amit Sanger
Amit
Sanger
Ritu Daipuriya
Ritu
Daipuriya
Manpreet Singh
Manpreet
Singh
Ramesh Chandra
Ramesh
Chandra
Data File 2: Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry
Optica Publishing Group
2016
constant
surface roughness
sample
surface characteristics
EMA
thickness
Lorentz coefficients
nm
ao
10 October 2016
Determination
Applied Optics
spectroscopic ellipsometry Correlation values
volume fraction
data
oxide
nanostructured Ti films
Drude
2016-10-10 00:00:00
Dataset
https://opticapublishing.figshare.com/articles/dataset/Data_File_2_Determination_of_optical_constants_including_surface_characteristics_of_optically_thick_nanostructured_Ti_films_analyzed_by_spectroscopic_ellipsometry/4930100
Correlation values between the surface roughness, thickness & volume fraction of oxide/Ti EMA layer and Drude & Lorentz coefficients for the sample T2~250 nm. Originally published in Applied Optics on 10 October 2016 (ao-55-29-8368)