%0 DATA
%A Jyoti, Jaiswal
%A Satyendra, Mourya
%A Gaurav, Malik
%A Samta, Chauhan
%A Amit, Sanger
%A Ritu, Daipuriya
%A Manpreet, Singh
%A Ramesh, Chandra
%D 2016
%T Data File 3: Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry
%U https://osapublishing.figshare.com/articles/Data_File_3_Determination_of_optical_constants_including_surface_characteristics_of_optically_thick_nanostructured_Ti_films_analyzed_by_spectroscopic_ellipsometry/4930103
%R 10.1364/AO.55.008368.d003
%2 https://osapublishing.figshare.com/ndownloader/files/8297780
%K constant
%K sample
%K surface characteristics
%K EMA
%K Lorentz coefficients
%K ao
%K 10 October 2016
%K thickness
%K Determination
%K Applied Optics
%K surface roughness
%K spectroscopic ellipsometry Correlation values
%K volume fraction
%K data
%K nm
%K oxide
%K nanostructured Ti films
%K Drude
%X Correlation values between the surface roughness, thickness & volume fraction of oxide/Ti EMA layer and Drude & Lorentz coefficients for the sample T3~500 nm. Originally published in Applied Optics on 10 October 2016 (ao-55-29-8368)