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oe-15-17-10767-m001.AVI (1.59 MB)

Media 1: Characterization of a subwavelength-scale 3D void structure using the FDTD-based confocal laser scanning microscopic image mapping technique

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posted on 2007-08-20, 00:00 authored by Kyongsik Choi, James W. M. Chon, Min Gu, Byoungho Lee
Originally published in Optics Express on 20 August 2007 (oe-15-17-10767)

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    Optics Express

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    subwavelength-scale 3 D void structureimage mapping techniquemediaOptics ExpressCharacterizationoe20 August 2007FDTD-based confocal laser scanning

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    CC BY 4.0

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