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Media 1: Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

journal contribution

posted on 2012-10-22, 00:00 authored by Ondrej Mandula, Martin Kielhorn, Kai Wicker, Gerhard Krampert, Ingo Kleppe, Rainer Heintzmann

Originally published in Optics Express on 22 October 2012 (oe-20-22-24167)

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scan media oe Optics Express sample 22 October 2012 illumination microscopy super-resolution imaging

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