oe-15-4-1851-m002.AVI (2.67 MB)

Media 2: Far-field scattering microscopy applied to analysis of slow light, power enhancement, and delay times in uniform Bragg waveguide gratings

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posted on 19.02.2007 by W. C. L. Hopman, H. J. W. M. Hoekstra, R. Dekker, L. Zhuang, R .M. de Ridder
Originally published in Optics Express on 19 February 2007 (oe-15-4-1851)

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