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Media 6: Nanoscale roughness micromilled silica evanescent refractometer

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journal contribution
posted on 2015-01-26, 00:00 authored by Lewis G. Carpenter, Peter A. Cooper, Christopher Holmes, Corin B. E. Gawith, James C. Gates, Peter G. R. Smith
Originally published in Optics Express on 26 January 2015 (oe-23-2-1005)

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    Optics Express

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    evanescentmediaoeOptics ExpressroughnessrefractometerNanoscale26 January 2015micromilled

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