Visulization2.mov (372.48 kB)
Visulization2.mov
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posted on 2018-10-01, 14:17 authored by Rafael PiestunInvestigation of lateral misalignment tolerance. Visualization 2 shows the reconstructed pattern under both 633nm and 532nm illumination as the second layer is misaligned from -20 to 20 micron. The corresponding diffraction efficiency and relative error are plotted in Fig. S3a.