Supplementary document for High-performance imaging of cell-substrate contacts using refractive index quantification microscopy - 4900227.pdf

Xin, Ziqiang; Zhang, Chonglei; Sun, Lixun; Wan, Chao; Chen, Ting; Chen, Houkai; Wang, Min; Wang, Yijia; Zhu, Siwei; Yuan, Xiaocong

doi:10.6084/m9.figshare.13129484.v2

4900227.pdf (1.73 MB)

Supplementary document for High-performance imaging of cell-substrate contacts using refractive index quantification microscopy - 4900227.pdf

Version 2 2020-11-11, 16:10

Version 1 2020-11-11, 16:10

journal contribution

posted on 2020-11-11, 16:10 authored by Ziqiang Xin, Chonglei Zhang, Lixun Sun, Chao Wan, Ting Chen, Houkai Chen, Min Wang, Yijia Wang, Siwei Zhu, Xiaocong Yuan

The calibration of the slit width under an atomic force microscope, the other two experimental data to calibrate the resolution and calibration of penetration of the evanescent field.