oe-17-10-7818-m001.AVI (2.27 MB)

Media 1: Profilometry without phase unwrapping using multi-frequency and four-step phase-shift sinusoidal fringe projection

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posted on 11.05.2009, 00:00 by Eun-Hee Kim, Joonku Hahn, Hwi Kim, Byoungho Lee
Originally published in Optics Express on 11 May 2009 (oe-17-10-7818)

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