Synchrotron X-Ray Metrology of Dopant Distribution and Oxidation State in High Pressure CVD Grown TM2+:ZnSe Optical Fibers

Posted on 11.01.2021 - 15:29
High pressure chemical deposition (HPCVD) has shown to be a promising method for producing Cr2+:ZnSe and Fe2+:ZnSe mid-IR optical fiber lasers. The oxidation state of the dopants and their spatial homogeneity are critical to characterize for effective fiber laser performance; however, this is challenging for small fiber cores and small doping concentrations. We demonstrate x-ray near-edge spectroscopy (XANES) of these unique fiber structures synthesized by HPCVD to confirm that indeed the dopants are in the +2 oxidation state as desired. Furthermore, using synchrotron micro x-ray fluorescence and absorption spectroscopy, we map the distribution of the dopants throughout the fiber cross-section, as well as study the local chemical environment of the dopants using micro X-ray near edge absorption spectroscopy(XANES). It reveals that transition metal doped ZnSe deposited using HPCVD has nanoscale dopant aggregation although the material is chemically identical to the commercially produced diffusion doped laser crystals. The work demonstrates the power of synchrotron-based x-ray techniques as metrology tools for improving the performance of laser materials in fiber geometry.

CITE THIS COLLECTION

Select your citation style and then place your mouse over the citation text to select it.
Coco, Michael; Aro, Stephen; Hendrickson, Alexander; Krug, James; Lai, Barry; Cai, Zhonghou; et al. (2021): Synchrotron X-Ray Metrology of Dopant Distribution and Oxidation State in High Pressure CVD Grown TM2+:ZnSe Optical Fibers. The Optical Society. Collection. https://doi.org/10.6084/m9.figshare.c.5231870.v2
or

SHARE

email
Publisher Logo

AUTHORS (10)

Michael Coco
Stephen Aro
Alexander Hendrickson
James Krug
Barry Lai
Zhonghou Cai
Pier Sazio
Sean McDaniel
Gary Cook
Venkatraman Gopalan

CATEGORIES

need help?